Grain size and electrical resistivity measurements on...

Grain size and electrical resistivity measurements on aluminum polycrystalline thin films

Diego Chaverri, Alejandro Saenz, Victor Castano
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Volume:
12
Year:
1991
Language:
english
DOI:
10.1016/0167-577x(91)90114-l
File:
PDF, 637 KB
english, 1991
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