Electromigration activation energy in pure aluminum films...

Electromigration activation energy in pure aluminum films deposited by partially ionized beam technique

O.V. Kononenko, E.D. Ivanov, V.N. Matveev, I.I. Khodos
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Volume:
33
Year:
1995
Language:
english
DOI:
10.1016/0956-716x(95)00450-a
File:
PDF, 526 KB
english, 1995
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