In situ X-ray diffraction monitoring during metalorganic...

Journal of Crystal Growth 2012 / 12 Vol. 361

In situ X-ray diffraction monitoring during metalorganic vapor phase epitaxy growth of low-temperature-GaN buffer layer

Iida, Daisuke, Sowa, Mihoko, Kondo, Yasunari, Tanaka, Daiki, Iwaya, Motoaki, Takeuchi, Tetsuya, Kamiyama, Satoshi, Akasaki, Isamu
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
361
Language:
english
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2012.08.023
Date:
December, 2012
File:
PDF, 553 KB
english, 2012
Conversion to is in progress
Conversion to is failed