EELS measurements of boron concentration profiles in p-a-Si...

EELS measurements of boron concentration profiles in p-a-Si and nip a-Si solar cells

Bas B. Van Aken, Martial Duchamp, Chris B. Boothroyd, Rafal E. Dunin-Borkowski, Wim J. Soppe
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Volume:
358
Year:
2012
Language:
english
DOI:
10.1016/j.jnoncrysol.2011.12.055
File:
PDF, 775 KB
english, 2012
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