![](/img/cover-not-exists.png)
Kaufman, A. S. Intelligent testing with the WISC-R. New York: John Wiley & Sons, 1979, 268 pp., $22.95
Joseph E. Zins, William G. KnaufVolume:
17
Year:
1980
Language:
english
Pages:
2
DOI:
10.1002/1520-6807(198010)17:43.0.co;2-2
File:
PDF, 152 KB
english, 1980