Memristor structures for high scalability: Non-linear and...

Microelectronic Engineering 2013 Vol. 103; Iss. none

Memristor structures for high scalability: Non-linear and symmetric devices utilizing fabrication friendly materials and processes

Janice H. Nickel, John Paul Strachan, Matthew D. Pickett, C. Tom Schamp, J. Joshua Yang, John A. Graham, R. Stanley Williams
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Volume:
103
Year:
2013
Language:
english
DOI:
10.1016/j.mee.2012.09.007
File:
PDF, 916 KB
english, 2013
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