![](/img/cover-not-exists.png)
Soft error study in double gated FinFET-based SRAM cells with simultaneous and independent driven gates
V.N. Ramakrishnan, R. SrinivasanVolume:
43
Year:
2012
Language:
english
DOI:
10.1016/j.mejo.2012.05.014
File:
PDF, 1.11 MB
english, 2012