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Microscopic scale characterization and modeling of transistor degradation under HC stress
Yoann Mamy Randriamihaja, V. Huard, X. Federspiel, A. Zaka, P. Palestri, D. Rideau, D. Roy, A. BravaixVolume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.microrel.2012.04.005
File:
PDF, 1.60 MB
english, 2012