Microscopic scale characterization and modeling of...

Microscopic scale characterization and modeling of transistor degradation under HC stress

Yoann Mamy Randriamihaja, V. Huard, X. Federspiel, A. Zaka, P. Palestri, D. Rideau, D. Roy, A. Bravaix
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Volume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.microrel.2012.04.005
File:
PDF, 1.60 MB
english, 2012
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