Characterization and SPICE modeling of the CHC related...

Microelectronics Reliability 2012 Vol. 52; Iss. 9-10

Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs

N. Ayala, J. Martin-Martinez, R. Rodriguez, M.B. Gonzalez, M. Nafria, X. Aymerich, E. Simoen
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.microrel.2012.06.014
File:
PDF, 403 KB
english, 2012
Conversion to is in progress
Conversion to is failed