High temperature reliability of μtrench Phase-Change Memory devices
G. Navarro, S. Souiki, A. Persico, V. Sousa, J.-F. Nodin, C. Jahan, F. Aussenac, V. Delaye, O. Cueto, L. Perniola, B. De SalvoVolume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.microrel.2012.06.017
File:
PDF, 678 KB
english, 2012