Effect of residual stress on the electrical activity of...

Effect of residual stress on the electrical activity of dislocations in GaN light emitting diodes

T. Nshanian, P.N. Grillot, M. Holub, S. Watanabe, W. Götz
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Volume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.microrel.2012.06.046
File:
PDF, 591 KB
english, 2012
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