Analysis of current distribution on IGBT under unclamped...

Microelectronics Reliability 2012 Vol. 52; Iss. 9-10

Analysis of current distribution on IGBT under unclamped inductive switching conditions

Yohei Iwahashi, Yoshihito Mizuno, Masafumi Hara, Ryuzo Tagami, Masanori Ishigaki
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Volume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.microrel.2012.06.075
File:
PDF, 1.01 MB
english, 2012
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