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Test methodology of a new upset mechanism induced by protons in deep sub-micron devices
C. Weulersse, F. Miller, D. Alexandrescu, E. Schaefer, O. Crepel, R. GaillardVolume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.microrel.2012.06.076
File:
PDF, 851 KB
english, 2012