Influence of charge balance on the robustness of...

Microelectronics Reliability 2012 Vol. 52; Iss. 9-10

Influence of charge balance on the robustness of trench-based super junction diodes

A. Villamor-Baliarda, P. Vanmeerbeek, M. Riccio, V. d’Alessandro, A. Irace, J. Roig, D. Flores, P. Moens
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.microrel.2012.06.094
File:
PDF, 1.03 MB
english, 2012
Conversion to is in progress
Conversion to is failed