Thermal instability effects in SiC Power MOSFETs
Alberto Castellazzi, Tsuyoshi Funaki, Tsunenobu Kimoto, Takashi HikiharaVolume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.microrel.2012.06.096
File:
PDF, 1.06 MB
english, 2012