Through silicon in-circuit logic analysis for localizing...

Microelectronics Reliability 2012 Vol. 52; Iss. 9-10

Through silicon in-circuit logic analysis for localizing logic pattern failures

M.R. Bruce, L.K. Ross, C. Scholz, L. Joshi, Vrajesh Dave, C.M. Chua
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Volume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.microrel.2012.06.107
File:
PDF, 2.30 MB
english, 2012
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