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A closed-loop IGBT non-destructive tester
A. Ahmed, Y. Shadrokh, L. Coulbeck, A. Castellazzi, C.M. JohnsonVolume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.microrel.2012.06.108
File:
PDF, 1.13 MB
english, 2012