Reliability studies on GaN HEMTs with sputtered Iridium...

Microelectronics Reliability 2012 Vol. 52; Iss. 9-10

Reliability studies on GaN HEMTs with sputtered Iridium gate module

Richard Lossy, Hervé Blanck, Joachim Würfl
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.microrel.2012.06.154
File:
PDF, 604 KB
english, 2012
Conversion to is in progress
Conversion to is failed