A design for robust wide metal tracks

Microelectronics Reliability 2012 Vol. 52; Iss. 9-10

A design for robust wide metal tracks

M. Ackermann, V. Hein, C. Kovács, K. Weide-Zaage
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Volume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.microrel.2012.07.012
File:
PDF, 656 KB
english, 2012
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