Defect characterisation using pulsed eddy current thermography under transmission mode and NDT applications
Mengchun Pan, Yunze He, Guiyun Tian, Dixiang Chen, Feilu LuoVolume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.ndteint.2012.08.007
File:
PDF, 1.94 MB
english, 2012