Carbon background and ionization yield of an AMS system...

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2013 Vol. 294; Iss. none

Carbon background and ionization yield of an AMS system during 14C measurements of microgram-size graphite samples

Jakob Liebl, Peter Steier, Robin Golser, Walter Kutschera, Klaus Mair, Alfred Priller, Iris Vonderhaid, Eva Maria Wild
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Volume:
294
Year:
2013
Language:
english
DOI:
10.1016/j.nimb.2012.06.015
File:
PDF, 627 KB
english, 2013
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