PIXE (particle induced X-ray emission): A non-destructive...

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2012 Vol. 291; Iss. none

PIXE (particle induced X-ray emission): A non-destructive analysis method adapted to the thin decorative coatings of antique ceramics

Y. Leon, Ph. Sciau, A. Bouquillon, L. Pichon, Ph. de Parseval
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Volume:
291
Year:
2012
Language:
english
DOI:
10.1016/j.nimb.2012.09.010
File:
PDF, 533 KB
english, 2012
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