Secondary Electron Yield of Emissive Materials for Large-Area Micro-Channel Plate Detectors: Surface Composition and Film Thickness Dependencies
Slade J. Jokela, Igor V. Veryovkin, Alexander V. Zinovev, Jeffrey W. Elam, Anil U. Mane, Qing Peng, Z. InsepovVolume:
37
Year:
2012
Language:
english
DOI:
10.1016/j.phpro.2012.03.718
File:
PDF, 616 KB
english, 2012