Influence of Multiple Angled Columnar Defects on Critical Current Density and n–Value in YBCO Thin Films
Tetsuro Sueyoshi, Takahiro Nishimura, Takanori Fujiyoshi, Fumiaki Mitsugi, Tomoaki Ikegami, Norito IshikawaVolume:
36
Year:
2012
DOI:
10.1016/j.phpro.2012.06.212
File:
PDF, 303 KB
2012