Study of Drain Induced Barrier Lowering(DIBL) Effect for Strained Si nMOSFET
JiangTao Qu, HeMing Zhang, XiaoBo Xu, ShanShan QinVolume:
16
Year:
2011
Language:
english
DOI:
10.1016/j.proeng.2011.08.1087
File:
PDF, 276 KB
english, 2011