Electrical and Reliability Analysis for GDH High-k Films...

Electrical and Reliability Analysis for GDH High-k Films After Rapid Thermal Annealing

Xiaona Wang, Xingqiang Zhang, Yuhua Xiong, Jun Du, Mengmeng Yang
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
27
Year:
2012
DOI:
10.1016/j.proeng.2011.12.492
File:
PDF, 488 KB
2012
Conversion to is in progress
Conversion to is failed