![](/img/cover-not-exists.png)
Reducing stiction in microelectromechanical systems by rough nanometer-scale films grown by atomic layer deposition
R.L. Puurunen, A. Häärä, H. Saloniemi, J. Dekker, M. Kainlauri, H. Pohjonen, T. Suni, J. Kiihamäki, E. Santala, M. Leskelä, H. KattelusVolume:
188
Year:
2012
Language:
english
DOI:
10.1016/j.sna.2012.01.040
File:
PDF, 692 KB
english, 2012