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Non-destructive technique to detect local buried defects in metal sample by scanning microwave microscopy
J. Rossignol, C. Plassard, E. Bourillot, O. Calonne, M. Foucault, E. LesniewskaVolume:
186
Year:
2012
Language:
english
DOI:
10.1016/j.sna.2012.06.027
File:
PDF, 886 KB
english, 2012