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(110) and (100) Sidewall-oriented FinFETs: A performance and reliability investigation
Young, C.D., Akarvardar, K., Baykan, M.O., Matthews, K., Ok, I., Ngai, T., Ang, K.-W., Pater, J., Smith, C.E., Hussain, M.M., Majhi, P., Hobbs, C.Volume:
78
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2012.05.045
Date:
December, 2012
File:
PDF, 1.48 MB
english, 2012