Static test compaction for IDDQ testing of bridging faults in sequential circuits
Yoshinobu Higami, Kewal K. Saluja, Yuzo Takamatsu, Kozo KinoshitaVolume:
31
Year:
2000
Language:
english
Pages:
10
DOI:
10.1002/1520-684x(200010)31:113.0.co;2-f
File:
PDF, 335 KB
english, 2000