Determination of the structure of GeO2-SiO2 glasses by EXAFS and X-ray scattering
R.B. Greegor, F.W. Lytle, J. Kortright, A. Fischer-ColbrieVolume:
89
Year:
1987
Language:
english
DOI:
10.1016/s0022-3093(87)80274-0
File:
PDF, 736 KB
english, 1987