Determination of the structure of GeO2-SiO2 glasses by...

Determination of the structure of GeO2-SiO2 glasses by EXAFS and X-ray scattering

R.B. Greegor, F.W. Lytle, J. Kortright, A. Fischer-Colbrie
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Volume:
89
Year:
1987
Language:
english
DOI:
10.1016/s0022-3093(87)80274-0
File:
PDF, 736 KB
english, 1987
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