Surface structure analysis of Si(111)√3 × √3-Bi by X-ray diffraction — Approach to the solution of the phase problem
Toshio Takahashi, Shinichiro Nakatani, Tetsuya Ishikawa, Seishi KikutaVolume:
191
Year:
1987
Language:
english
DOI:
10.1016/s0039-6028(87)81179-2
File:
PDF, 427 KB
english, 1987