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Properties of oxidized silicon as determined by angular-dependent X-ray photoelectron spectroscopy
J.M. Hill, D.G. Royce, C.S. Fadley, L.F. Wagner, F.J. GrunthanerVolume:
44
Year:
1976
Language:
english
Pages:
7
DOI:
10.1016/0009-2614(76)80496-4
File:
PDF, 756 KB
english, 1976