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Description and validation of high-throughput simultaneous genotyping and mutation scanning by high-resolution melting curve analysis
T. Nguyen, F. Lesueur, N. Forey, D. De Silva, R. Weigel, S. Tavtigian, F. Le Calvez-KelmVolume:
6
Year:
2008
Language:
english
DOI:
10.1016/s1359-6349(08)71558-1
File:
PDF, 85 KB
english, 2008