Thickness measurements of nanoscale brine films on silica surfaces under geologic CO 2 sequestration conditions using synchrotron X-ray fluorescence
Kim, Tae Wook, Tokunaga, Tetsu K., Shuman, Derek B., Sutton, Stephen R., Newville, Matt, Lanzirotti, AntonioVolume:
48
Language:
english
Journal:
Water Resources Research
DOI:
10.1029/2012wr012200
Date:
September, 2012
File:
PDF, 1.78 MB
english, 2012