Thickness measurements of nanoscale brine films on silica...

Thickness measurements of nanoscale brine films on silica surfaces under geologic CO 2 sequestration conditions using synchrotron X-ray fluorescence

Kim, Tae Wook, Tokunaga, Tetsu K., Shuman, Derek B., Sutton, Stephen R., Newville, Matt, Lanzirotti, Antonio
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
48
Language:
english
Journal:
Water Resources Research
DOI:
10.1029/2012wr012200
Date:
September, 2012
File:
PDF, 1.78 MB
english, 2012
Conversion to is in progress
Conversion to is failed