A 30-ns 64-Mb DRAM with built-in self-test and self-repair...

IEEE Journal of Solid-State Circuits 1992 Vol. 27; Iss. 11

A 30-ns 64-Mb DRAM with built-in self-test and self-repair function

Tanabe, A., Takeshima, T., Koike, H., Aimoto, Y., Takada, M., Ishijima, T., Kasai, N., Hada, H., Shibahara, K., Kunio, T., Tanigawa, T., Saeki, T., Sakao, M., Miyamoto, H., Nozue, H., Ohya, S., Murota
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Volume:
27
Year:
1992
Language:
english
DOI:
10.1109/4.165332
File:
PDF, 1.06 MB
english, 1992
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