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An experimental 256-Mb DRAM with boosted sense-ground scheme
Asakura, M., Ooishi, T., Tsukude, M., Tomishima, S., Eimori, T., Hidaka, H., Ohno, Y., Arimoto, K., Fujishima, K., Nishimura, T., Yoshihara, T.Volume:
29
Year:
1994
Language:
english
DOI:
10.1109/4.328628
File:
PDF, 655 KB
english, 1994