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Testable design of BiCMOS circuits for stuck-open fault detection using single patterns
Menon, S.M., Malaiya, Y.K., Jayasumana, A.P., Rajsuman, R.Volume:
30
Year:
1995
Language:
english
DOI:
10.1109/4.400427
File:
PDF, 1.01 MB
english, 1995