Yield and reliability of MNOS EEPROM products

IEEE Journal of Solid-State Circuits 1989 Vol. 24; Iss. 6

Yield and reliability of MNOS EEPROM products

Kamigaki, Y., Minami, S.-I., Hagiwara, T., Furusawa, K., Furuno, T., Uchida, K., Terasawa, M., Yamazaki, K.
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Volume:
24
Year:
1989
Language:
english
DOI:
10.1109/4.45010
File:
PDF, 1.01 MB
english, 1989
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