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A latch-up-like new failure mechanism for high-density CMOS dynamic RAMs
Furuyama, T., Ishiuchi, H., Tanaka, H., Watanabe, Y., Kohyama, Y., Kimura, T., Muraoka, K., Sugiura, S., Natori, K.Volume:
25
Year:
1990
Language:
english
DOI:
10.1109/4.50282
File:
PDF, 589 KB
english, 1990