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Soft-defect detection (SDD) technique for a high-reliability CMOS SRAM
Kuo, C., Toms, T., Neel, B.T., Jelemensky, J., Carter, E.A., Smith, P.Volume:
25
Year:
1990
Language:
english
DOI:
10.1109/4.50285
File:
PDF, 667 KB
english, 1990