Single-ended SRAM with high test coverage and short test...

Single-ended SRAM with high test coverage and short test time

Chua-Chin Wang, Chi-Feng Wu, Rain-Ted Hwang, Chia-Hsiung Kao
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Volume:
35
Year:
2000
Language:
english
DOI:
10.1109/4.818928
File:
PDF, 115 KB
english, 2000
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