A software-based CM and DM measurement system for the...

IEEE Transactions on Industrial Electronics 2000 Vol. 47; Iss. 4

A software-based CM and DM measurement system for the conducted EMI

Yu-Kang Lo, Huang-Jen Chiu, Tzu-Herng Song
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Volume:
47
Year:
2000
Language:
english
DOI:
10.1109/41.857980
File:
PDF, 115 KB
english, 2000
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