Probabilistic simulation for reliability analysis of CMOS...

Probabilistic simulation for reliability analysis of CMOS VLSI circuits

Najm, F.N., Burch, R., Yang, P., Hajj, I.N.
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Volume:
9
Year:
1990
Language:
english
DOI:
10.1109/43.45875
File:
PDF, 1.24 MB
english, 1990
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