The complexity of fault detection in MOS VLSI circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 1990 Vol. 9; Iss. 9

The complexity of fault detection in MOS VLSI circuits

Najm, F.N., Hajj, I.N.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
9
Year:
1990
Language:
english
DOI:
10.1109/43.59075
File:
PDF, 713 KB
english, 1990
Conversion to is in progress
Conversion to is failed