iTEM: a temperature-dependent electromigration reliability...

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 1997 Vol. 16; Iss. 8

iTEM: a temperature-dependent electromigration reliability diagnosis tool

Chin-Chi Teng, Yi-Kan Cheng, Rosenbaum, E., Sung-Mo Kang
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
16
Year:
1997
Language:
english
DOI:
10.1109/43.644613
File:
PDF, 456 KB
english, 1997
Conversion to is in progress
Conversion to is failed