ILLIADS-T: an electrothermal timing simulator for...

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 1998 Vol. 17; Iss. 8

ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips

Yi-Kan Cheng, Raha, P., Chin-Chi Teng, Rosenbaum, E., Sung-Mo Kang
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Volume:
17
Year:
1998
Language:
english
DOI:
10.1109/43.712099
File:
PDF, 510 KB
english, 1998
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