Application of BEM to high-voltage junction termination

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2001 Vol. 20; Iss. 10

Application of BEM to high-voltage junction termination

Zilu Wu, Yumin Gao, Jinsheng Luo, Xun Hou, Guofu Chen
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Volume:
20
Year:
2001
Language:
english
DOI:
10.1109/43.952738
File:
PDF, 149 KB
english, 2001
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