Iddq testing for CMOS VLSI

Proceedings of the IEEE 2000 Vol. 88; Iss. 4

Iddq testing for CMOS VLSI

Rajsuman, R.
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Volume:
88
Year:
2000
Language:
english
DOI:
10.1109/5.843000
File:
PDF, 1.59 MB
english, 2000
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