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Reliability of MOCVD grown AlGaAs/GaAs laser diodes at -20 C heatsink temperature
Begley, D.L., Dreisewerd, D., Fritz, W., Schwedt, S., Elliott, G., Langill, T., Luft, J., Wudy, E.Volume:
2
Year:
1990
Language:
english
DOI:
10.1109/68.54691
File:
PDF, 316 KB
english, 1990